Time-of-Flight Photoelectron Spectroscopy of Atoms and Molecules

Document Type

Article

Publication Date

10-2001

Publication Title

Journal of Alloys and Compounds

Publisher

Elsevier

Volume

328

Issue

2021-01-02

First page number:

27

Last page number:

34

Abstract

Following the advent of third-generation synchrotron-radiation sources with ultra-high brightness and X-ray pulse widths of a few picoseconds, the technique of time-of-flight (TOF) electron spectroscopy has experienced a dramatic enhancement in energy resolution. Using soft-X-ray beams focused to 100 μm or less, a new gas-phase TOF-photoelectron apparatus in operation at the Advanced Light Source (ALS) has demonstrated electron energy resolution as high as 8000 (E/ΔE), comparable to some of the best electrostatic analyzers, while maintaining the traditional efficiency of the TOF technique. This apparatus is being used to probe limitations of basic approximations in X-ray photoemission: (1) the independent-particle approximation, and (2) the dipole approximation. In both cases, new limits of these approximations have been discovered in unexpected photon-energy regimes. This paper includes an overview of the TOF technique as well as a summary of results from the ALS on limits of these basic approximations.

Controlled Subject

Photoelectron spectroscopy; Photoionization; Synchrotron radiation; Time-of-flight mass spectrometry

Disciplines

Atomic, Molecular and Optical Physics | Physical Chemistry

File Format

PDF

Language

English

Permissions

Use Find in Your Library, contact the author, or use interlibrary loan to garner a copy of the article. Publisher copyright policy allows author to archive post-print (author’s final manuscript). When post-print is available or publisher policy changes, the article will be deposited.

Rights

IN COPYRIGHT. For more information about this rights statement, please visit http://rightsstatements.org/vocab/InC/1.0/

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