Separating Non-linear Optical Signals of a Sample from High Harmonic Radiation in a Soft X-ray Free Electron Laser

Authors

Toshihide Sumi, The University of Tokyo
Masafumi Horio, The University of Tokyo
Tomoaki Senoo, The University of Tokyo
Tetsuya Wada, The University of Tokyo
Yuki Tsujikawa, The University of Tokyo
Xiaoni Zhang, The University of Tokyo
Paul Manset, Ecole Normale Superieure de Paris
Mihoko Araki, The University of Tokyo
Yasuyuki Hirata, Nation Defense Academy of Japan, Yokosuka
Walter S. Drisdell, Lawrence Berkeley National Laboratory
John W. Freeland, Argonne National Laboratory
Angelique Amadno, University of California, Berkeley
Michael Zuerch, University of California, Berkeley
Yuya Kubota, RIKEN SPring-8 Center
Shigeki Owada, Japan Synchrotron Radiation Research Institute
Kensuke Tono, RIKEN SPring-8 Center
Makina Yabashi, RIKEN SPring-8 Center
Craig P. Schwartz, University of Nevada, Las Vegas
Iwao Matsuda, The University of Tokyo

Document Type

Article

Publication Date

2-5-2022

Publication Title

e-Journal of Surface Science and Nanotechnology

Volume

20

Issue

1

First page number:

31

Last page number:

35

Abstract

Second harmonic generation (SHG) is a unique non-linear optical effect that can be used to investigate chemical states of molecules at surfaces/interfaces. By the use of soft X-rays, SHG gains element selectivity through the inner-core excitation resonance. However, it is challenging to observe SHG signals separately from the second-order light generated from the undulator. Here, we report a new ellipsometry method for soft X-ray SHG to suppress the contribution of second-harmonic radiation from the light source. Through measurements of a GaAs(100) crystal, we demonstrate that pure SHG signals can be obtained for the horizontally polarized component. The present method is generally applicable regardless of the incident photon energy and hence the absorption edge of the targeted materials. If combined with optical filters blocking the second-harmonic radiation and equipped with soft X-ray phase shifters, the method allows one to obtain further information from SHG signals such as tensor components of second-order non-linear susceptibility.

Keywords

Non-linear spectroscopy; Soft X-rays; Extreme UV; X-ray free electron laser; Multilayer mirror

Disciplines

Atomic, Molecular and Optical Physics

File Format

PDF

File Size

1512 KB

Language

English

Rights

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Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

Repository Citation

Sumi, T., Horio, M., Senoo, T., Wada, T., Tsujikawa, Y., Zhang, X., Manset, P., Araki, M., Hirata, Y., Drisdell, W. S., Freeland, J. W., Amadno, A., Zuerch, M., Kubota, Y., Owada, S., Tono, K., Yabashi, M., Schwartz, C. P., Matsuda, I. (2022). Separating Non-linear Optical Signals of a Sample from High Harmonic Radiation in a Soft X-ray Free Electron Laser. e-Journal of Surface Science and Nanotechnology, 20(1), 31-35.
Available at: http://dx.doi.org/10.1380/ejssnt.2022-002